Impurity ‘Hot Spots’ in MBE HgCdTe/CdZnTe
| Autor: | Andrew J. Stoltz, A. Yulius, L. A. Almeida, L. O. Bubulac, Jeffrey M. Peterson, Scott M. Johnson, M. Carmody, M. Jaime-Vasquez, P. J. Smith, A. Wang, J. D. Benson, M. Reddy, R. N. Jacobs, D. D. Lofgreen, J. M. Arias, J. W. Bangs, Priyalal Wijewarnasuriya |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Solid-state physics Analytical chemistry Hot spot (veterinary medicine) 02 engineering and technology Substrate (electronics) 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Focused ion beam Electronic Optical and Magnetic Materials Impurity 0103 physical sciences Scanning transmission electron microscopy Materials Chemistry Electrical and Electronic Engineering 0210 nano-technology Molecular beam epitaxy |
| Zdroj: | Journal of Electronic Materials. 47:5671-5679 |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | In this work, impurity ‘hot spot’ macro-defects—high impurity level macro-defect contaminates were examined. ‘Hot spots’ have very high localized concentrations of: K, Mg, Ni, Cr, Mn, Ca, Al, Na, Fe, and Cu. For example, these ‘hot spot’ macro-defects can have Cu concentrations > 1 × 1018 cm−3. Focused ion beam scanning transmission electron microscopy analysis of four ‘hot spots’ was performed. The origin of ‘hot spot’ defects is unresolved—however, our analysis has shown ‘hot spots’ can arise due to molecular beam epitaxy spit defects and CdZnTe substrate defects. The estimated ‘hot spot’ density is ∼ 30 cm−2. The presence of impurity ‘hot spot’ macro-defects in HgCdTe/CdZnTe is confirming evidence for the occurrence of L. Bubulac’s impurity ‘pipe’ mechanism. |
| Databáze: | OpenAIRE |
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