Stereographic technique for quantitative analysis for cleavage plane orientation

Autor:	Po-Shou Chen, R.C. Wilcox
Rok vydání:	1991
Předmět:	Materials science business.industry Mechanical Engineering Energy-dispersive X-ray spectroscopy Stereographic projection Crystal growth Cleavage (crystal) Surface finish Condensed Matter Physics Optics Mechanics of Materials Cathode ray General Materials Science business Normal Single crystal
Zdroj:	Materials Characterization. 26:9-15
ISSN:	1044-5803
DOI:	10.1016/1044-5803(91)90003-m
Popis:	A stereoscopic method for use with x-ray energy dispersive spectroscopy of rough surfaces was adapted and applied to the fracture surface of a nickel alloy single crystal to permit rapid orientation determinations of small cleavage planes. The method uses a mathematical treatment of stereo pair photomicrographs to measure the angle between the electron beam and the surface normal. One reference crystal orientation corresponding to the electron beam direction (crystal growth direction) is required to perform this trace analysis. An area as small as 10 μm can be analyzed. The sensitivity of this technique was evaluated using a specimen with known orientation.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fd812117fee36d862145c9aca736fbd6 https://doi.org/10.1016/1044-5803(91)90003-m Zobrazit plný text záznamu