Distinguishing Thermal and Electronic Effects in Ultrafast Optical Spectroscopy Using Oxide Heterostructures
| Autor: | Sergey Y. Smolin, Amber K. Choquette, Jiayi Wang, Steven J. May, Jason B. Baxter |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Materials science
business.industry Band gap Physics::Optics Heterojunction 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Condensed Matter::Materials Science General Energy Semiconductor Ultrafast laser spectroscopy Optoelectronics Transient (oscillation) Physical and Theoretical Chemistry Thin film 0210 nano-technology business Spectroscopy Ultrashort pulse |
| Zdroj: | The Journal of Physical Chemistry C. 122:115-123 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.7b09592 |
| Popis: | Measuring time-resolved photoexcited properties in semiconductors is critical to the design and improvement of light-harvesting devices. Although ultrafast pump–probe spectroscopy offers a promising route to understand carrier recombination mechanisms and quantify lifetimes, thermal contributions to the transient optical response can be significant and need to be properly accounted for to isolate carrier-induced contributions. We demonstrate the use of broadband ultrafast optical spectroscopy on type I heterostructures as a means to isolate transient effects that are solely thermal in nature. Specifically, we use transient absorption and reflectance spectroscopy to measure the time-resolved optoelectronic changes in photoexcited epitaxial bilayers of LaFeO3/LaMnO3 and monolithic thin films of these materials. Experiments and complementary numerical modeling reveal that thermal effects dominate the transient absorption and reflectance spectra above the band gap. Fitting the dynamics with a thermal diffusio... |
| Databáze: | OpenAIRE |
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