A Flying‐Spot Scanner
| Autor: | C. N. Potter, D. E. Sawyer |
|---|---|
| Rok vydání: | 1968 |
| Předmět: |
Scanner
Materials science Cathode ray tube business.industry ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION computer.file_format Sample (graphics) Collimated light law.invention Semiconductor Optics Hardware_GENERAL law Raster graphics Raster scan business Instrumentation computer Beam (structure) ComputingMethodologies_COMPUTERGRAPHICS |
| Zdroj: | Review of Scientific Instruments. 39:180-183 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1683310 |
| Popis: | A flying‐spot scanner used to study the electrical properties of semiconductor materials and devices is described. The instrument automatically deflects a collimated light beam in a raster pattern and focuses the raster on the photosensitive semiconductor surface. The electrical output from the semiconductor is amplified and used to form an image of the photoresponse of the sample on a cathode ray tube. The resolution of the system referred to the sample is about 5 μ. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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