Autor: |
Hirokazu Tatsuoka, Hiroshi Kuwabara, Tsutomu Koga, Tomotaka Suzuki, Alexander Bright, Ken Shimada |
Rok vydání: |
2000 |
Předmět: |
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Zdroj: |
Thin Solid Films. 369:248-252 |
ISSN: |
0040-6090 |
DOI: |
10.1016/s0040-6090(00)00817-8 |
Popis: |
β-FeSi 2 and FeSi layers were grown on Si substrates by deposition of Sb-related intermetallic compounds and simultaneous reaction with Si substrates. Higher quality epitaxialβ-FeSi 2 layers with smooth interfaces were obtained on the Si(111) substrates at the substrate temperatures ranging from 650 to 700°C in comparison to the layers grown by conventional reactive deposition epitaxy (RDE). Moreover, the growth mechanism of FeSi and Sb-related intermetallic compounds have been discussed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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