| Autor: |
Holger Arthaber, Thomas Faseth, Erich Schlaffer, Oliver Huber |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
2015 IEEE 16th Annual Wireless and Microwave Technology Conference (WAMICON). |
| Popis: |
This paper focuses on the description of loss behavior up to 110 GHz for two commercially widely used transmission line modes, microstrip (MS) and conductor backed coplanar waveguide (CBCPW). Within this investigation special attention has been drawn to the applied manufacturing processes as each process has distinct tolerances and etching behavior. The measured data is based on a comparison of 50 Ω transmission lines manufactured on two different substrates and for two structuring processes, pattern plating and panel plating. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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