Quantitative depth‐dependent analysis using the inelastic scattering backgrounds from X‐ray photoelectron spectroscopy and hard X‐ray photoelectron spectroscopy

Autor:	Billy J. Murdoch, Phuong Y. Le, James G. Partridge, Dougal G. McCulloch
Rok vydání:	2023
Předmět:	Materials Chemistry Surfaces and Interfaces General Chemistry Condensed Matter Physics Surfaces Coatings and Films
Zdroj:	Surface and Interface Analysis. 55:373-382
ISSN:	1096-9918 0142-2421
DOI:	10.1002/sia.7206
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fc0d9026f5bbcefd2a84666bf4ff636c https://doi.org/10.1002/sia.7206 Zobrazit plný text záznamu Plný text