Monocrystalline Si waffles for thin solar cells fabricated by the novel perforated-silicon process

Autor:	S. Oelting, Hans Artmann, Jürgen H. Werner, Rolf Brendel, W. Frey, Hans J. Queisser
Rok vydání:	1998
Předmět:	Materials science Fabrication Silicon business.industry chemistry.chemical_element General Chemistry Substrate (electronics) Epitaxy law.invention Monocrystalline silicon Optics chemistry law Solar cell Optoelectronics General Materials Science Thin film business Layer (electronics)
Zdroj:	Applied Physics A: Materials Science & Processing. 67:151-154
ISSN:	1432-0630 0947-8396
DOI:	10.1007/s003390050753
Popis:	We apply the novel perforated-silicon process (Ψ-process) for the fabrication of thin (a few microns thick) monocrystalline silicon layers for solar cells with textured surfaces for efficient light trapping. A silicon layer grows epitaxially on the porous surface of a textured monocrystalline Si substrate. Mechanical stress splits the porous layer and thereby separates the epitaxial layer from the substrate. X-ray diffraction analysis proves monocrystallinity for our 5.8-μm-thick Si layer. Ray tracing simulations correctly model the optical reflectance measurements. The simulations predict a maximum short-circuit current of 36.5 mA/cm 2 for this waffle-shaped film when it is attached to glass substrates.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fbd1dc07d77a2ac8363c636fe9544413 https://doi.org/10.1007/s003390050753 Zobrazit plný text záznamu Plný text ve formátu PDF