Autor: |
C.K. Yoon, Ki-il Hong, S. Daniel, Young-Wug Kim, Sang-Woon Lee |
Rok vydání: |
1995 |
Předmět: |
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Zdroj: |
33rd IEEE International Reliability Physics Symposium. |
DOI: |
10.1109/relphy.1995.513659 |
Popis: |
Temperature profiles of surface mount components progressing through convection and infrared reflow systems are studied with respect to package size, inter-component spacing, and loading density. For constant forcing temperature, T/sub max/ varies inversely with component mass. A minimum component spacing required to minimize T/sub max/ variation is established. Package delamination and cracking are shown to depend primarily on T/sub max/. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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