| Autor: |
Gennady I. Zebrev, Anton O. Balbekov, Maxim S. Gorbunov |
| Rok vydání: |
2017 |
| Předmět: |
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| Zdroj: |
2017 IEEE 30th International Conference on Microelectronics (MIEL). |
| DOI: |
10.1109/miel.2017.8190133 |
| Popis: |
We present the simulation results comparing the upset sensitivity of different types of the majority voters. We conducted the SPICE-level simulations by means of the proposed technique that provides layout-aware analysis taking into account diffusion and circuit effects. The calibration of the model parameters was provided by the analysis of experimental SEU cross section and sensitivity maps of 6T-cell based SRAM designed and manufactured using the same technology as the majority voters. We also consider the applicability margins of the proposed model. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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