Research on Failure Mechanism of a Digital to Analog Converter Induced by Electrochemical Decay
| Autor: | Weiming Zhu, Wang Kunshu, Yang Liangliang, Lian Pengfei, Zhang Hui, Kong Zebin, Pan Ying, Lou Jianshe, Xixi Wang |
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| Rok vydání: | 2020 |
| Předmět: | |
| Zdroj: | IOP Conference Series: Earth and Environmental Science. 514:052040 |
| ISSN: | 1755-1315 1755-1307 |
| Popis: | This paper focus on mechanism of a digital to analog converter induced by electrochemical decay. The electrical parameters and the I/V characteristics of the digital to analog converter are abnormal, and the 11-pin of the device are open because of the decay. By the scanning electron microscope inspection and the energy spectrum analysis to the decay, the carbon and the oxygen of the decay are relatively high, and there exists decaying elements chlorine. The mechanism of the electrochemical decay is analysed, the reason of the electrochemical decay contains three elements: moisture, decaying elements and electric field. Moreover, the 11-pin has the worst decay resulted from the strongest electric field, inducing the opening of 11-pin and the failure of the digital to analog converter. |
| Databáze: | OpenAIRE |
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