L. Reimer, Scanning Electron Microscopy — Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, Volume 45. Editiorial Board: J. M. Enoch, D. L. Macadam, A. L. Schawlow, K. Shimoda and T. Tamir). XVIII + 457 S., 247 Abb., 5 Tab. Berlin-Heidelberg-New York-Tokyo 1985. Springer Verlag. DM 112,00. ISBN: 3-540-13530-8

Autor:	Augsten
Rok vydání:	1987
Předmět:	Image formation Physics Volume (thermodynamics) Polymer science Scanning electron microscope Analytical chemistry General Medicine Applied Microbiology and Biotechnology Microanalysis
Zdroj:	Journal of Basic Microbiology. 27:166-166
ISSN:	1521-4028 0233-111X
DOI:	10.1002/jobm.3620270311
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fade22065a617e0b6ccf44c604e1a262 https://doi.org/10.1002/jobm.3620270311 Zobrazit plný text záznamu Plný text