Simulation of RHEED intensity oscillations during MBE growth

Autor:	J.P.A. van der Wagt, James S. Harris
Rok vydání:	1993
Předmět:	Reflection high-energy electron diffraction business.industry Chemistry Condensed Matter Physics Epitaxy Signal Quantitative model Inorganic Chemistry Condensed Matter::Materials Science Optics Materials Chemistry Signal intensity Thin film Atomic physics business Intensity (heat transfer)
Zdroj:	Journal of Crystal Growth. 127:1025-1029
ISSN:	0022-0248
DOI:	10.1016/0022-0248(93)90782-r
Popis:	We develop a quantitative model for computation of the RHEED signal intensity during epitaxial growth. The growth surface is described in a way that naturally allows for tilted substrates. Oscillations in the computed RHEED signal during MBE growth exhibit a very fast decay. We are able to identify the fast initial rise of the signal after stopping growth with disappearing single atoms, and the slower subsequent recovery with growing terrace sizes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fac521ea75ced7036c5537fd682ba033 https://doi.org/10.1016/0022-0248(93)90782-r Zobrazit plný text záznamu