Correlating Complementary Data for Improving Electron Backscatter Diffraction (EBSD) Microstructural Characterization of Geological Materials
Autor: | Stuart I. Wright, Shawn W. Wallace, T. Nylese, Matthew M. Nowell, Jens Rafaelsen, René de Kloe |
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Rok vydání: | 2017 |
Předmět: |
Crystallography
Materials science Metallurgy 02 engineering and technology Geological materials 010502 geochemistry & geophysics 021001 nanoscience & nanotechnology 0210 nano-technology 01 natural sciences Instrumentation 0105 earth and related environmental sciences Characterization (materials science) Electron backscatter diffraction |
Zdroj: | Microscopy and Microanalysis. 23:2166-2167 |
ISSN: | 1435-8115 1431-9276 |
Databáze: | OpenAIRE |
Externí odkaz: |