Autor: |
Wei Yi Lim, Ka Fai Chang, M. Annamalai Arasu, Jason Goh, Seow Meng Low, M. Kumarasamy Raja |
Rok vydání: |
2015 |
Předmět: |
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Zdroj: |
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC). |
DOI: |
10.1109/eptc.2015.7412393 |
Popis: |
Horizontal probe station poses challenges in determining performance of vertical interposers for test socket. In this paper, a PCB test structure has been proposed for measurement of our designed interposers up to 20 GHz. A new test structure is further proposed and simulated with HFSS to achieve a higher operating frequency. By converting the S-parameters of test structures to T-parameters and splitting of cascaded blocks using optimization method, the performance of an individual vertical interposer can be obtained. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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