Lifetime modeling based on anodic oxidation failure for packages with internal galvanic isolation
| Autor: | Rainer Markus Schaller, Rainer Dudek, Horst Theuss, Sven Rzepka, Volker Strutz |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Silicon business.industry Anodic oxidation Electrical engineering chemistry.chemical_element Hardware_PERFORMANCEANDRELIABILITY Mechatronics 01 natural sciences Engineering physics Stress (mechanics) chemistry Power electronics 0103 physical sciences Electrode Hardware_INTEGRATEDCIRCUITS business Galvanic isolation Voltage |
| Zdroj: | 2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). |
| DOI: | 10.1109/eurosime.2017.7926272 |
| Popis: | In More-than-Moore technologies, the number and complexity of micro and nano devices, that are directly integrated into control units of power electronics and mechatronics systems, increase. These systems typically operate at working voltages in the range of 220–1000 V RMS [1]. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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