Calibration of meters for measuring semiconductor diodes by means of the capacitance-resistance divider method

Autor:	V. S. Blagoveshchenskii
Rok vydání:	1973
Předmět:	Semiconductor Materials science business.industry Applied Mathematics Calibration Optoelectronics business Instrumentation Capacitance Diode
Zdroj:	Measurement Techniques. 16:268-270
ISSN:	1573-8906 0543-1972
DOI:	10.1007/bf00812573
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::fa2498d38b7e49cb548d67182b78fe92 https://doi.org/10.1007/bf00812573 Zobrazit plný text záznamu Full text from SpringerLink