Soft error mechanism in SOI D flip-flop induced by space electrostatic discharge

Autor:	Run-Jie Yuan, Rui Chen, Jian-Wei Han, Xuan Wang, Qian Chen, Ya-Nan Liang, Jie Zhou
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 136:114648
ISSN:	0026-2714
DOI:	10.1016/j.microrel.2022.114648
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f9fefb85a7979a0c375bcd2cc30e04b8 https://doi.org/10.1016/j.microrel.2022.114648 Zobrazit plný text záznamu Full Text from ScienceDirect