IEEE P1581 ¿ Getting More Board Test Out of Boundary Scan

Autor:	Heiko Ehrenberg, Bob Russell, Bradford Treuren
Rok vydání:	2006
Předmět:	Boundary scan testing Boundary scan SIMPLE (military communications protocol) Low overhead Computer engineering Computer science Design for testing Joint Test Action Group Test (assessment) Boundary scan description language
Zdroj:	ITC
ISSN:	1089-3539
DOI:	10.1109/test.2006.297707
Popis:	IEEE P1581 has undergone significant improvement since its introduction. This paper explains the choice of simple, low overhead solutions the proposed standard provides in overcoming one of Boundary Scan's greatest bottlenecks: test of complex memory devices. Design for Testability guidelines are provided to allow board designers and test engineers to take full advantage of this new test technique.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f9ecebec9f79634709d14be3141f8854 https://doi.org/10.1109/test.2006.297707 Zobrazit plný text záznamu