Vacuum ultraviolet reflectivity measurements of thin‐film electroluminescent phosphors

Autor:	R. L. Thuemler, John F. Wager, T. K. Plant, R. H. Mauch, S. S. Sun, D. C. Morton, K. Lite
Rok vydání:	1996
Předmět:	Strontium sulfide Materials science Physics and Astronomy (miscellaneous) business.industry Band gap Phosphor Electroluminescence Temperature measurement Zinc sulfide chemistry.chemical_compound chemistry Optoelectronics Thin film business Stoichiometry
Zdroj:	Applied Physics Letters. 69:3525-3527
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.117233
Popis:	Vacuum ultraviolet reflectivity measurements of three thin‐film electroluminescent phosphors, zinc sulfide (ZnS), strontium sulfide (SrS), and strontium‐calcium thiogallate (Sr0.45Ca0.55Ga2S4), are reported using thin‐film samples. Measured ZnS reflectivity peak positions are in agreement with values previously reported in the literature. SrS room temperature reflectivity measurements are found to be consistent with previously reported low temperature measurements. Reflectivity measurements of Sr0.45Ca0.55Ga2S4 are reported for the first time; the reflectivity spectrum is found to rise monotonically above the band gap and to exhibit almost no structure, except for a small shoulder at ∼6.8 eV and a single, broad peak at ∼8.5 eV. The unusual nature of the Sr0.45Ca0.55Ga2S4 reflectivity spectrum is attributed to positional disorder in the stoichiometric thiogallate film.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f9bbf3f2886015b47560de9331290a5f https://doi.org/10.1063/1.117233 Zobrazit plný text záznamu