Mechanism of thermal runaway in solar cells

Autor:	Tetsuya Nakamura, Mitsuru Imaizumi, Kazuya Murai, Ryuta Kawamura, Ikuo NANNO
Rok vydání:	2023
Předmět:	General Engineering General Physics and Astronomy
Zdroj:	Japanese Journal of Applied Physics.
ISSN:	1347-4065 0021-4922
DOI:	10.35848/1347-4065/accfa4
Popis:	To clarify the mechanism of thermal runaway in solar cells, our study included experiments and simulations that focused on changes in the size of the shunt spot where thermal runaway occurs. Our analysis suggests that the rapid temperature increase of the shunt spot leading to failure is caused by the positive feedback of increased backflow current, increased heat generation, and reduced shunt spot size (i.e., increased combined thermal resistance between the shunt spot and normal cell area). The thermal runaway tolerance can be improved by designing solar cells with negative feedback that prevents positive feedback from progressing.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f9a0234cc80dac13ea791c92292eb6de https://doi.org/10.35848/1347-4065/accfa4 Zobrazit plný text záznamu