A general approach for determining the switching probability in rapid single flux quantum logic circuits
| Autor: | Hannes Toepfer, Hermann F. Uhlmann, Thomas Ortlepp |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Superconductivity
Josephson effect Physics Comparator Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Topology Electronic Optical and Magnetic Materials law.invention law Quantum mechanics Rapid single flux quantum Logic gate Hardware_INTEGRATEDCIRCUITS Bit error rate Fokker–Planck equation Electrical and Electronic Engineering Flip-flop Hardware_LOGICDESIGN |
| Zdroj: | IEEE Transactions on Appiled Superconductivity. 11:280-283 |
| ISSN: | 1051-8223 |
| DOI: | 10.1109/77.919338 |
| Popis: | A major restriction in the development of a working Rapid Single Flux Quantum (RSFQ) logic circuit with high-Tc superconductors is given by the influence of thermal noise. This gives reason to ask for a general determination of the digital bit error rate. As other approaches, our method of calculating the switching probability is based on the Fokker-Planck equation. In the past few years the bit error rates for a single Josephson junction, SQUIDs and the comparator were calculated by using this theory. We demonstrate numerical solution of the multidimensional Fokker-Planck equation to calculate bit error rates due to thermal noise for a Toggle Flip Flop circuit. In the present work, we combine thermal noise analysis with the effects of process variations in order to derive rules for designing high-Tc RSFQ logic circuits. |
| Databáze: | OpenAIRE |
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