Atomic scale elemental mapping of light elements in multilayered perovskite coatings
| Autor: | Corneliu Ghica, Valentin S. Teodorescu, R.F. Negrea |
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| Rok vydání: | 2015 |
| Předmět: |
Materials science
Atomic de Broglie microscope business.industry Electron energy loss spectroscopy General Physics and Astronomy Heterojunction Nanotechnology Surfaces and Interfaces General Chemistry Condensed Matter Physics Atomic units Surfaces Coatings and Films Characterization (materials science) law.invention Condensed Matter::Materials Science Transmission electron microscopy law Optoelectronics Thin film Electron microscope business |
| Zdroj: | Applied Surface Science. 355:250-255 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2015.07.106 |
| Popis: | Spherical aberration corrected transmission electron microscopes offer unprecedented capabilities in materials structural characterization down to atomic resolution. Electron energy loss spectroscopy (EELS) – spectrum imaging (SI) and annular bright field (ABF) imaging allow to simultaneously identify both the position and nature of the atomic species in a crystalline material. These techniques, along with conventional high-resolution transmission electron microscopy are particularly useful in heterostructures interfaces like epitaxial multilayers characterization, for identifying possible atomic interdiffusion at sub-nanometric scale. This paper presents the structural and compositional microanalysis down to atomic resolution of an epitaxial BaTiO3/SrRuO3/SrTiO3 ferroelectric heterostructure using complex complementary analytical electron microscopy techniques. The atomic arrangement of both heavy and light atomic species across the interfaces in the BaTiO3/SrRuO3/SrTiO3 heterostructures is revealed. |
| Databáze: | OpenAIRE |
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