WBT System for Logic Circuit Experiments with Tutoring Function

Autor:	Hideki Murakoshi, Yuki Furuzono
Rok vydání:	2006
Předmět:	Computer science Logic gate Function (mathematics) Electrical and Electronic Engineering Arithmetic Industrial and Manufacturing Engineering
Zdroj:	IEEJ Transactions on Industry Applications. 126:1500-1506
ISSN:	1348-8163 0913-6339
DOI:	10.1541/ieejias.126.1500
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f9272697a09ae3ce17f3e9d4d447c448 https://doi.org/10.1541/ieejias.126.1500 Zobrazit plný text záznamu