Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer
Autor: | Joseph Junio, J. Christoph Scheytt, A. Awny, Lothar Moeller, Andreas Thiede |
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Rok vydání: | 2014 |
Předmět: | |
Zdroj: | IEEE Journal of Solid-State Circuits. 49:452-470 |
ISSN: | 1558-173X 0018-9200 |
DOI: | 10.1109/jssc.2013.2285385 |
Popis: | A millimeter wave frequency mixed-signal design of a 1-tap half-rate look-ahead decision feedback equalizer for 80 Gb/s short-reach optical communication systems is presented. On-wafer tests are developed to determine the maximum operating bit rate of the equalizer. Results are also presented for intersymbol interference mitigation at 80 Gb/s for a 20 GHz bandwidth-limited channel. Further improvements on the architecture of the 80 Gb/s equalizer are discussed and used in the design and on-wafer measurement of a 110 Gb/s equalizer. The equalizers are designed in a 0.13 μm SiGe:C BiCMOS technology. The 80 and 110 Gb/s versions dissipate 4 and 5.75 W, respectively and occupy 2 and 2.56 mm2, respectively. |
Databáze: | OpenAIRE |
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