In-situ Surface Temperature Monitoring through Wafer Temperature Sensing and Heat Transfer Modeling for O2/N2 Plasma Process

Autor: Solbaro Kim, Hyun-woo Oh, Kwang-bo Sim
Rok vydání: 2022
Zdroj: 2022 IEEE 2nd International Conference on Electronic Technology, Communication and Information (ICETCI).
DOI: 10.1109/icetci55101.2022.9832050
Databáze: OpenAIRE