Static Performance Assessment of Junctionless Accumulation Mode Gate Stack Gate All Around (JAM-GS-GAA) FinFET Under Severe Temperature

Autor:	Bhavya Kumar, Megha Sharma, Rishu Chaujar
Rok vydání:	2021
Zdroj:	2021 7th International Conference on Signal Processing and Communication (ICSC).
DOI:	10.1109/icsc53193.2021.9673255
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f89d3a374f7fcdbf6747bdee459820f9 https://doi.org/10.1109/icsc53193.2021.9673255 Zobrazit plný text záznamu