Influence of Nonlinear Intensity Attenuation in Bright-Field TEM Images on Tomographic Reconstructions of Micron-Scaled Materials

Autor:	Shuichi Yuasa, Shigeo Arai, Jun Yamasaki, Shigemasa Ohta, Katsuhiro Sasaki, Michihiro Mutoh, Nobuo Tanaka
Rok vydání:	2015
Předmět:	Nonlinear system Materials science Optics Field (physics) business.industry Attenuation business Instrumentation Intensity (heat transfer)
Zdroj:	Microscopy and Microanalysis. 21:993-994
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927615005760
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f896abcd0e6ab581254dd7e58a7fdabd https://doi.org/10.1017/s1431927615005760 Zobrazit plný text záznamu