Fick's law of diffusion depth profiles applied to the degradation of oxidized polystyrene during ARXPS analysis
| Autor: | M. Ménard, R. W. Paynter |
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| Rok vydání: | 2005 |
| Předmět: |
SAMPLE history
Diffusion Analytical chemistry chemistry.chemical_element Surfaces and Interfaces General Chemistry Condensed Matter Physics Oxygen Surfaces Coatings and Films chemistry.chemical_compound Polymer degradation X-ray photoelectron spectroscopy chemistry Diffusion process Materials Chemistry Irradiation Polystyrene |
| Zdroj: | Surface and Interface Analysis. 37:466-471 |
| ISSN: | 1096-9918 0142-2421 |
| DOI: | 10.1002/sia.2036 |
| Popis: | Angle-resolved x-ray photoelectron spectroscopy (ARXPS) measurements were made, using Al Ka and Mg Ka radiation alternately, on a polystyrene sample that had been exposed to a helium plasma. It was observed that oxygen was introduced into the sample surface by the plasma treatment, and that some of it was lost over a period of 5 h under x-ray irradiation in the vacuum of the spectrometer. Laplace transforms of Fick's law of diffusion profiles were derived and applied to the data. The ARXPS results obtained in this study are consistent with a sample history in which the oxidation of the polymer surface resulting from exposure to plasma is controlled by a diffusion process, whereas the loss of oxygen during exposure to x-rays is principally controlled by a first-order reaction such as the liberation of oxygen (presumably as CO 2 ) from carbon-oxygen groups by the action of radicals created by the ionizing radiation. |
| Databáze: | OpenAIRE |
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