Bit Swapping and Cell Ordering on Finding Faults in Test Pattern Generation using BIST

Autor:	Anandhi. K
Rok vydání:	2018
Předmět:	Bit (horse) business.industry Computer science Pattern generation business Computer hardware Test (assessment)
Zdroj:	International Journal for Research in Applied Science and Engineering Technology. 6:377-382
ISSN:	2321-9653
DOI:	10.22214/ijraset.2018.5062
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f86c64747f47d3b7c8e3447cc0e41792 https://doi.org/10.22214/ijraset.2018.5062 Zobrazit plný text záznamu