Electronic Structure Characterization of the Bi-YIG by EELS-STEM

Autor:	G. Herrera-Pérez, M. García-Guaderrama, Juan Pedro Palomares-Báez, N. Herrera-Pineda, C. Ornelas-Gutierrez, M. E. Fuentes-Montero, J. M. Nápoles-Duarte, W. Antunez-Flores, R. Ochoa-Gamboa
Rok vydání:	2019
Předmět:	Materials science business.industry Optoelectronics Electronic structure business Instrumentation Characterization (materials science)
Zdroj:	Microscopy and Microanalysis. 25:666-667
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927619004069
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f8680c8dd844a6f5513a2c3c9340eb76 https://doi.org/10.1017/s1431927619004069 Zobrazit plný text záznamu