Effect of weak magnetic fields on the dynamics of variation in the microhardness of silicon under low-intensity beta irradiation

Autor: A. A. Dmitrievskiĭ, V. E. Ivanov, M. Yu. Tolotaev, Yu. I. Golovin, N. Yu. Suchkova
Rok vydání: 2007
Předmět:
Zdroj: Physics of the Solid State. 49:865-867
ISSN: 1090-6460
1063-7834
DOI: 10.1134/s1063783407050101
Popis: Weak magnetic fields with an induction B = 0.28 T are found to have an effect on the transformation of subsystems of structural (intrinsic and radiation-induced) silicon defects under irradiation with a low-intensity flux of beta particles (I = 105 cm−2 s−1). The effect of a weak magnetic field leads to an increase in fluences at which the disordering exhibits maxima.
Databáze: OpenAIRE