Effect of weak magnetic fields on the dynamics of variation in the microhardness of silicon under low-intensity beta irradiation
Autor: | A. A. Dmitrievskiĭ, V. E. Ivanov, M. Yu. Tolotaev, Yu. I. Golovin, N. Yu. Suchkova |
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Rok vydání: | 2007 |
Předmět: |
Materials science
Silicon Condensed matter physics Solid-state physics chemistry.chemical_element Flux equipment and supplies Condensed Matter Physics Electronic Optical and Magnetic Materials Magnetic field Paramagnetism chemistry Beta particle Irradiation human activities Intensity (heat transfer) |
Zdroj: | Physics of the Solid State. 49:865-867 |
ISSN: | 1090-6460 1063-7834 |
DOI: | 10.1134/s1063783407050101 |
Popis: | Weak magnetic fields with an induction B = 0.28 T are found to have an effect on the transformation of subsystems of structural (intrinsic and radiation-induced) silicon defects under irradiation with a low-intensity flux of beta particles (I = 105 cm−2 s−1). The effect of a weak magnetic field leads to an increase in fluences at which the disordering exhibits maxima. |
Databáze: | OpenAIRE |
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