Coercivity, structure, and stoichiometry of Permalloy/alumina multilayers

Autor:	R. E. Davis, T. M. Reith, N. J. Jubb, J.A. Leavitt, H. R. Kolar
Rok vydání:	1985
Předmět:	Permalloy Auger electron spectroscopy Crystallography Materials science Sputtering Transmission electron microscopy General Physics and Astronomy Substrate (electronics) Composite material Thin film Coercivity Stoichiometry
Zdroj:	Journal of Applied Physics. 57:4192-4194
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.334608
Popis:	A series of permalloy/alumina multilayers were examined to determine their structure, composition, and magnetic performance. The conditions of permalloy and alumina‐layer thickness, and substrate bias necessary to minimize the coercivity have been shown. Multilayer structures with alumina‐layer thicknesses of less than 100 A and permalloy‐layer thicknesses between 400 and 500 A had the lowest coercivities. Structures were examined by RBS, TEM, AES, and XRD to study the effect of bias sputtering on the structure and composition of the multilayers. It was found that sputtering multilayers at high biases did not affect the coercivity, but did cause significant physical and chemical changes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f82580778a66bf9738e5c784ee3730a9 https://doi.org/10.1063/1.334608 Zobrazit plný text záznamu