| Autor: |
M. Benk, K. Bergmann, A. Querejeta-Fernández, S. Srivastava, N. A. Kotov, D. Schaefer, T. Wilhein, Ian McNulty, Catherine Eyberger, Barry Lai |
| Rok vydání: |
2011 |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings. |
| ISSN: |
0094-243X |
| DOI: |
10.1063/1.3625395 |
| Popis: |
Soft x‐ray microscopy is well suited to investigation of nanoparticles in liquid media. Using a table‐top microscope based on a gas‐discharge source emitting at 2.88 nm, dried CdTe nanowires and dried PbS hyperbranched nanocrystals are investigated. These structures are the result of the assembly of nanoparticles in a liquid environment. Soft x‐ray microscopy is aiming at a better understanding of underlying parameters that affect the self assembly to the desired final structures. It is shown that the presented setup is able to image these particles with a resolution of about 50 nm with exposure times in the range of tens of seconds. The discharge source has a photon flux of more than 109 photons/(sr s μm2) at a photon energy of 430 eV with a bandwidth of λ/Δλ = 840. The repetition rate of the source is up to 1000 Hz. With the current setup a photon flux of 5×106 photons/(μm2 s) at the sample is achieved. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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