Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components
| Autor: | E. N. Kamysheva, S. V. Chakhlov, S. P. Osipov, S. A. Shchetinkin, E. Yu. Usachev |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Structural material Photon business.industry Astrophysics::High Energy Astrophysical Phenomena Mechanical Engineering Detector X-ray Condensed Matter Physics 01 natural sciences 030218 nuclear medicine & medical imaging 03 medical and health sciences 0302 clinical medicine Optics Mechanics of Materials Filter (video) 0103 physical sciences Range (statistics) General Materials Science Sensitivity (control systems) business 010301 acoustics Effective atomic number |
| Zdroj: | Russian Journal of Nondestructive Testing. 54:797-810 |
| ISSN: | 1608-3385 1061-8309 |
| DOI: | 10.1134/s1061830918110074 |
| Popis: | An approach to choosing the materials and thicknesses of detectors and an intermediate filter is considered in a material recognition method based on single X-raying of a test object with separate detection of soft and hard photons. The approach combines the maximum sensitivity to changes in the effective atomic number and the minimum error of its estimation. An example is given of selecting the parameters of the detectors and intermediate filter for X-ray energies in the range from 100 to 300 keV. |
| Databáze: | OpenAIRE |
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