Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip

Autor:	William V. Huott, Mary P. Kusko, Peilin Song, T.J. Snethen, Bryan J. Robbins, T.G. Foote
Rok vydání:	2002
Předmět:	Boundary scan Computer science business.industry Design for testing System testing Automatic test pattern generation Chip law.invention Microprocessor Built-in self-test law Embedded system IBM business
Zdroj:	ITC
DOI:	10.1109/test.1998.743216
Popis:	This paper describes the test tool methodology used for the IBM S/390 microprocessor. An efficient, effective, and automated process providing correct-by-construction test pattern generation, an effective test pattern set, and diagnostics were required. This paper explains the techniques used to accomplish this along with explaining why the method was chosen and how it helped expedite the process.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f748827698b543611d0eec167cd379da https://doi.org/10.1109/test.1998.743216 Zobrazit plný text záznamu