Photoelectron spectroscopy of [CH(AsF5)0.1]x
| Autor: | C.B. Duke, Alan G. MacDiarmid, E. W. Plummer, H.R. Thomas, W.R. Salaneck, Alan J. Heeger |
|---|---|
| Rok vydání: | 1980 |
| Předmět: |
Auger electron spectroscopy
Dopant Photoemission spectroscopy Chemistry Mechanical Engineering Chemical shift Metals and Alloys Analytical chemistry Condensed Matter Physics Electron spectroscopy Electronic Optical and Magnetic Materials Condensed Matter::Materials Science X-ray photoelectron spectroscopy Mechanics of Materials Condensed Matter::Superconductivity Physics::Atomic and Molecular Clusters Materials Chemistry Molecule Ultraviolet photoelectron spectroscopy |
| Zdroj: | Synthetic Metals. 1:133-138 |
| ISSN: | 0379-6779 |
| DOI: | 10.1016/0379-6779(80)90004-1 |
| Popis: | We have studied pure and various stages of AsF 5 -doped polyacetylenes by X-ray and ultraviolet photoelectron spectroscopy (XPS and UPS), as well as X-ray-induced Auger electron spectroscopy (XAES). Spectra on the doped polymers are analyzed by comparison with corresponding spectra on the model molecules AsF 3 and AsF 5 in both the gaseous and condensed phases. The chemical composition of the dopant species can be addressed by interpretation of spectra on the basis of escape depths of the photoelectrons. The degree charge transfer from the host polymer to the dopant molecules results from an analysis of the chemical shifts of the C(1s) spectra of the doped polymers. |
| Databáze: | OpenAIRE |
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