Research on digital integrated circuit testing technology under Internet of Things technology

Autor:	Ai Min Li, Yi Feng Meng
Rok vydání:	2023
Zdroj:	Second International Conference on Green Communication, Network, and Internet of Things (CNIoT 2022).
DOI:	10.1117/12.2670654
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f721015e64dc794608883b743f57d6c0 https://doi.org/10.1117/12.2670654 Zobrazit plný text záznamu