Device-Circuit Co-Design and ESD/HCI Reliability Aware Design of Field Plated RF LDMOS Devices
Autor: | Harsha B Variar, Ajay Singh, Jhnanesh Somayaji, Mayank Shrivastava |
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Rok vydání: | 2022 |
Zdroj: | 2022 IEEE International Conference on Emerging Electronics (ICEE). |
DOI: | 10.1109/icee56203.2022.10118172 |
Databáze: | OpenAIRE |
Externí odkaz: |