Device-Circuit Co-Design and ESD/HCI Reliability Aware Design of Field Plated RF LDMOS Devices

Autor: Harsha B Variar, Ajay Singh, Jhnanesh Somayaji, Mayank Shrivastava
Rok vydání: 2022
Zdroj: 2022 IEEE International Conference on Emerging Electronics (ICEE).
DOI: 10.1109/icee56203.2022.10118172
Databáze: OpenAIRE