Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low-Temperature Cofired Ceramics Material Based on Nd2O3-TiO2-SiO2 Glass-Ceramics

Autor:	Hsing I. Hsiang, Li-Then Mei, Wen-Chang Liao, Fu-Su Yen
Rok vydání:	2010
Předmět:	Materials science Scanning electron microscope Mineralogy Dielectric law.invention law visual_art Phase (matter) Materials Chemistry Ceramics and Composites visual_art.visual_art_medium Ceramic Crystallization Composite material Glass transition Diffractometer High-κ dielectric
Zdroj:	Journal of the American Ceramic Society.
ISSN:	1551-2916 0002-7820
DOI:	10.1111/j.1551-2916.2010.03655.x
Popis:	The crystallization and sintering behaviors of glass–ceramics (Nd2O3–TiO2–SiO2) have been investigated using the differential thermal analyzer, thermal mechanical analyzer, X-ray diffractometer, scanning electron microscopy, and transmission electron microscopy. The results showed that the onset of glass shrinkage occurred at around the glass transition temperature (Tg=708°C). The first crystalline phase, Nd2Ti4O11, was observed at around 775°C. Fully densified NdTiSi glass can be obtained via glass viscous flow before the second crystalline phase, Nd0.66TiO3, occurring at about 850°C. The as-prepared NdTiSi glass–ceramics sintered at 900°C exhibited a high dielectric constant of 23 and a quality factor of about 600, which provided a promising candidate for low-temperature cofired ceramics applications.
Databáze:	OpenAIRE
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