TEM Analysis of Fe3O4/GaAs Hybrid Ferromagnet/Semiconductor Nanostructures

Autor:	Christopher B. Murray, J. Chen, Sahar Hihath, Paul M. Riechers, Richard A. Kiehl
Rok vydání:	2012
Předmět:	Materials science Ferromagnetism business.industry Optoelectronics Semiconductor nanostructures business Instrumentation Tem analysis
Zdroj:	Microscopy and Microanalysis. 18:1632-1633
ISSN:	1435-8115 1431-9276
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f6627d5dec625a01ec4421cfd47c2678 https://doi.org/10.1017/s143192761201001x Zobrazit plný text záznamu