Nanoscale resolution image plane holographic microscopy

Autor:	D. Paterson, Erik H. Anderson, W. Chao, Jaroslav Nejdl, Mario C. Marconi, Carmen S. Menoni, N. Monserut, Jorge J. Rocca, I. D. Howlett
Rok vydání:	2013
Předmět:	Materials science business.industry Resolution (electron density) Holography Image plane law.invention Optics Optical microscope law Multifocal plane microscopy Microscopy Optoelectronics Digital holographic microscopy business Image resolution
Zdroj:	2013 IEEE Photonics Conference.
Popis:	We demonstrate nanoscale spatial resolution image plane holographic microscopy at extreme ultraviolet wavelengths. We show the advantages of the method for imaging test pattern samples with an absorption contrast of ~30%.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f63e78cca3a9b3445cdda626d6ffeb98 https://doi.org/10.1109/ipcon.2013.6656438 Zobrazit plný text záznamu