Reproducibility of niobium junction critical currents: statistical analysis and data
| Autor: | S.L. Thomasson, A.D. Smith, C. Dang |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
Josephson effect
Superconductivity Materials science Condensed matter physics Niobium chemistry.chemical_element Statistical model Integrated circuit Condensed Matter Physics Line (electrical engineering) Electronic Optical and Magnetic Materials law.invention chemistry law Electrical and Electronic Engineering Type-II superconductor Current density |
| Zdroj: | IEEE Transactions on Applied Superconductivity. 3:2174-2177 |
| ISSN: | 1558-2515 1051-8223 |
| DOI: | 10.1109/77.233934 |
| Popis: | The authors present a statistical model to account for Josephson-junction critical current variability produced in integrated circuit processing. On the basis of data gathered from over a thousand junctions from the TRW superconducting integrated-circuit foundry line, it is shown that present niobium technology can produce junctions with critical currents identical to within a few percent, depending on junction size. Less than 2% (1 sigma ) spread critical currents were measured for 10 mu m junctions. > |
| Databáze: | OpenAIRE |
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