A 0.3-V to 1.8–3.3-V Leakage-Biased Synchronous Level Converter for ULP SoCs

Autor: Mehdi Saligane, Jeongsup Lee, David Blaauw, Dennis Sylvester
Rok vydání: 2020
Předmět:
Zdroj: IEEE Solid-State Circuits Letters. 3:130-133
ISSN: 2573-9603
Popis: This letter proposes a robust synchronous wide-range clocked level converter (LC) that converts subthreshold input signals to high I/O voltages for ultra-low power (ULP) SoCs. By biasing the circuit using nMOS leakage current, the design offers robust operation across a wide range of low- and high-supply voltages as well as PVT variations. The design was fabricated in 55-nm CMOS process and shows 60.5-fJ ( $V_{\mathrm{ DDH}}=2.5$ V) switching energy, marking a $2.6\times $ improvement over prior works.
Databáze: OpenAIRE