A behavior modeling method of integrated CMOS Hall element for circuit simulation
| Autor: | Pang Xiaomin, Ke Liu, Rongjiang Liu, Zhankun Du, Li Shao, Renwei Zhang |
|---|---|
| Rok vydání: | 2014 |
| Předmět: |
Engineering
business.industry Circuit design Electrical engineering Mixed-signal integrated circuit Electrical element Hardware_PERFORMANCEANDRELIABILITY Discrete circuit Circuit extraction Computer Science::Hardware Architecture Computer Science::Emerging Technologies CMOS Hardware_INTEGRATEDCIRCUITS Electronic engineering Equivalent circuit Physical design business Hardware_LOGICDESIGN |
| Zdroj: | 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT). |
| DOI: | 10.1109/icsict.2014.7021684 |
| Popis: | A behavior modeling method for Hall element in standard CMOS technology is proposed in this work. Using equivalent parameters, the whole Hall device is represented by lumped circuit elements. The usually concerned factors including mismatch, temperature, stress, and geometry are taken into account in this model. Considering the convenience of integration with following readout and processing circuits, this modeling is set up by items that could be simulated together with other circuits in EDA environment. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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