Epitaxial growth of Fe/Pd-multilayers onto sapphire

Autor:	T. Steffl, Ch. Muller, H. Mühlbauer, Bernd Rellinghaus, Günter Dumpich
Rok vydání:	2000
Předmět:	Inorganic Chemistry Crystallography Tetragonal crystal system Reflection high-energy electron diffraction Chemistry Superlattice Materials Chemistry Sapphire Crystal structure Thin film Condensed Matter Physics Epitaxy Vacuum evaporation
Zdroj:	Journal of Crystal Growth. 218:410-418
ISSN:	0022-0248
DOI:	10.1016/s0022-0248(00)00558-3
Popis:	Epitaxial [ Fe (0 0 1)/ Pd (0 0 1)] n multilayers are prepared onto sapphire substrates under ultrahigh-vacuum conditions. The topography and structure of the layers and their interfaces are characterized using in situ STM and RHEED and ex situ XRD. Although the lattice mismatch between the two materials amounts to about 4%, we find epitaxial growth up to n =32 bilayers. Our investigations reveal that with increasing Fe-layer thickness the iron lattice gradually changes from a face-centered tetragonal (fct) to a body-centered tetragonal (bct) structure.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f5146a8bb3be0ce0c40077d4e29531c8 https://doi.org/10.1016/s0022-0248(00)00558-3 Zobrazit plný text záznamu Full Text from ScienceDirect