A 0.4μm Gate-All-Around TFT (GAT) Using a Dummy Nitride Pattern for High Density Memories

Autor: Natsuro Tsubouchi, Shigenobu Maeda, O. Tanina, Hirotada Kuriyama, Y. Inoue, Takashi Ipposhi, Shigeto Maegawa, Hisayuki Nishimura
Rok vydání: 1994
Předmět:
Zdroj: Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials.
DOI: 10.7567/ssdm.1994.a-12-2
Databáze: OpenAIRE