X-ray production yield in standardized thick target PIXE

Autor:	Nemitala Added, Marcia de Almeida Rizzutto, Marcel Dupret Lopes Barbosa, Manfredo Harri Tabacniks, Jim Heiji Aburaya
Rok vydání:	2006
Předmět:	Detection limit Nuclear and High Energy Physics Materials science Analytical chemistry X-ray chemistry.chemical_element Boric acid Matrix (chemical analysis) chemistry.chemical_compound chemistry Yield (chemistry) Thin film Instrumentation Carbon Beam energy
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 249:792-795
ISSN:	0168-583X
DOI:	10.1016/j.nimb.2006.03.141
Popis:	A computer program CLARA that calculates a correction factor for thick target PIXE analysis is described. Using CLARA, the analysis of a powdered sample diluted in a light matrix can be corrected for X-ray self-absorption and beam energy loss to use the regular thin film PIXE yields. Dilutions of powders in boric acid were simulated for two extreme cases: carbon and iron powders. In the first case, a 10% addition of carbon changed a pre-defined thick target correction factor, R i , less than 5% for all elements. On the other hand, 10% of iron changed R i to about 7% for elements with Z > 21 but showed a 50% loss for the Al content. Using the same procedure, the analysis of Marine Sediment SRM IAEA-356 diluted to 1% in boric acid showed excellent agreement with the referenced data, although compromising somewhat the detection limits.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f4f400c557c50af6a7401886eeb32bc5 https://doi.org/10.1016/j.nimb.2006.03.141 Zobrazit plný text záznamu Full Text from ScienceDirect