The influence of tensoeffect on TCR and stability of resistors

Autor:	Nikolay Yurkov, Yu. A. Osipov, R. R. Avanesyan, V. M. Telegin, A. V. Blinov
Rok vydání:	1999
Předmět:	Materials science Applied Mathematics T-cell receptor Substrate (electronics) Deformation (meteorology) Thermal expansion law.invention law Resistive element sense organs Thin film Resistor Composite material Instrumentation FOIL method
Zdroj:	Measurement Techniques. 42:655-657
ISSN:	1573-8906 0543-1972
DOI:	10.1007/bf02512086
Popis:	We consider the influence of tensoeffects on the TCR and relative change of resistance in resistors made of foil, thin film and thick film. This phenomenon is due to deformation of the resistive element caused by differences between the coefficients of bulk thermal expansion in the film and its substrate.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f4ec79bfb2634ee84a5596184d124b8f https://doi.org/10.1007/bf02512086 Zobrazit plný text záznamu Full text from SpringerLink