Temperature-dependent bit-error rate of a clocked superconducting digital circuit
| Autor: | Marc J. Feldman, M.W. Johnson, Q.P. Herr |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Physics
Digital electronics business.industry Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Chip Topology Optimal control Noise (electronics) Electronic Optical and Magnetic Materials Error function Logic gate Hardware_INTEGRATEDCIRCUITS Bit error rate Electrical and Electronic Engineering business Error detection and correction |
| Zdroj: | IEEE Transactions on Appiled Superconductivity. 9:3594-3597 |
| ISSN: | 1051-8223 |
| DOI: | 10.1109/77.783807 |
| Popis: | We measured the bit-error rate (BER) of an RS latch, a clocked SFQ circuit. A digital error-detection circuit was used to detect BER in the range unity to 10/sup -13/; below 10/sup -7/, the circuit was operated with a 12 GHz on-chip clock. BER was measured as a function of control current; both positive and negative control current was applied, leading to two distinct modes of error incidence. The error function curves extrapolate to 10/sup -80/ for optimal control current at a temperature of 5.5 K. Measurements were repeated over the range 3-7 K. Comparison to theoretical error-function estimates of BER indicate that the noise is strictly thermal. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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